Hello Dear Readers, Today in this post, I will provide some deep insight into the Signal Electromigration (Signal EM): Violations, Examples, and Practical Fixes. 1. Introduction: As technology nodes shrink into the deep‑submicron and nanometer regime (7nm, 5nm, 3nm and beyond), electromigration (EM) has become a first‑order reliability concern—not only for power/ground (PG) networks but also for signal nets. Signal EM failures are often underestimated because signal currents are transient and bidirectional. However, with higher switching activity, tighter metal pitches, thinner wires, and aggressive timing closure, signal EM can cause latent or early‑life failures if not addressed properly. This article explains: What Signal EM is and how it differs from PG EM Typical Signal EM violation scenarios Detailed, practical examples Root causes behind each violation Proven solutions and best practices to fix and prevent Signal EM issues 2. What is Signal Electromigration: El...
Hello Dear Readers, Today in this post I will provide some deep insight into the simulation. So let's start. Simulation: Before software tools were developed, the verification of a particular circuit design could only be achieved by the construction of a prototype circuit. While the designer could use standard digital and analog techniques to design the circuit on paper. it was almost impossible to determine whether the circuit would perform as expected in practice. These 'bread boarded' prototype circuits were constructed using discrete components such as individual logic gates, transistors, resistors, capacitors, etc. When built, the circuit would be thoroughly tested and design modifications made on the basis of these tests. The next version of the prototype was then constructed and the process repeated. Such an approach technique was very time-consuming and expensive and resulted in a very long development time. Translation from breadboard to chip often resulted in ...