Hello Dear Readers, Today in this post, I will provide some deep insight into the Signal Electromigration (Signal EM): Violations, Examples, and Practical Fixes. 1. Introduction: As technology nodes shrink into the deep‑submicron and nanometer regime (7nm, 5nm, 3nm and beyond), electromigration (EM) has become a first‑order reliability concern—not only for power/ground (PG) networks but also for signal nets. Signal EM failures are often underestimated because signal currents are transient and bidirectional. However, with higher switching activity, tighter metal pitches, thinner wires, and aggressive timing closure, signal EM can cause latent or early‑life failures if not addressed properly. This article explains: What Signal EM is and how it differs from PG EM Typical Signal EM violation scenarios Detailed, practical examples Root causes behind each violation Proven solutions and best practices to fix and prevent Signal EM issues 2. What is Signal Electromigration: El...
Hello Dear Readers, Today in this post we will discuss how the architecting speed inside will be changing by writing efficient RTL coding. Sophisticated tool optimizations are often not good enough to meet most design constraints if an arbitrary coding style is used. Here we will discuss the first of three primary physical characteristics of a digital design speed and also discuss methods for architectural optimization in an FPGA. There are three primary definitions of speed depending on the context of the problem: throughput, latency, and timing. In the context of processing data in an FPGA, throughput refers to the amount of data that is processed per clock cycle. A common metric for throughput in bits per second. Latency refers to the time between data input and processed data output. The typical metric for latency will be time or clock cycles. Timing refers to the logic delays between sequential elements. When we say a design does not “meet timing,” we mean that the de...